tm may 2012 fdp5n50f / fdpf5n50ft n-channel mosfet, frfet ?2012 fairchild semiconductor corporation fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 1 unifet tm fdp5n50f / fdpf5n50ft n-channel mosfet, frfet 500v, 4.5a, 1.55 features ?r ds(on) = 1.25 ( typ.)@ v gs = 10v, i d = 2.25a ? low gate charge ( typ. 11nc) ? low c rss ( typ. 5pf) ? fast switching ? 100% avalanche tested ? improved dv/dt capability ? rohs compliant description these n-channel enhancement mode power field effect transistors are produced using fairchild?s proprietary, planar stripe, dmos technology. this advanced technology has be en especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high en ergy pluse in the avalanche and commutation mode. these devices are well suited for high efficient switched mode power suppliesand active power factor- correction. d g s to-220f fdpf series g s d to-220 fdp series g d s mosfet maximum ratings t c = 25 o c unless otherwise noted* thermal characteristics symbol parameter fdp5n50f fdpf5n50ft units v dss drain to source voltage 500 v v gss gate to source voltage 30 v i d drain current -continuous (t c = 25 o c) 4.5 4.5* a -continuous (t c = 100 o c) 2.7 2.7* i dm drain current - pulsed (note 1) 18 18* a e as single pulsed avalanche energy (note 2) 233 mj i ar avalanche current (note 1) 4.5 a e ar repetitive avalanche energy (note 1) 8.5 mj dv/dt peak diode recovery dv/dt (note 3) 4.5 v/ns p d power dissipation (t c = 25 o c) 85 28 w - derate above 25 o c 0.67 0.22 w/ o c t j , t stg operating and storage temperature range -55 to +150 o c t l maximum lead temperature for soldering purpose, 1/8? from case for 5 seconds 300 o c symbol parameter fdp5n50f fdpf5n50ft units r jc thermal resistance, junction to case 1.4 4.5 o c/w r cs thermal resistance, case to sink typ. 0.5 - r ja thermal resistance, junction to ambient 62.5 62.5 *drain current limited by maximum junction temperature
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 2 package marking and ordering information t c = 25 o c unless otherwise noted electrical characteristics off characteristics on characteristics dynamic characteristics switching characteristics drain-source diod e characteristics device marking device package reel size tape width quantity fdp5n50f fdp5n50f to-220 - - 50 fdpf5n50ft fdpf5n50ft to-220f - - 50 symbol parameter test conditions min. typ. max. units bv dss drain to source breakdown voltage i d = 250 a, v gs = 0v, t j = 25 o c 500 - - v bv dss t j breakdown voltage temperature coefficient i d = 250 a, referenced to 25 o c-0.6-v/ o c i dss zero gate voltage drain current v ds = 500v, v gs = 0v - - 10 a v ds = 400v, t c = 125 o c - - 100 i gss gate to body leakage current v gs = 30v, v ds = 0v - - 100 na v gs(th) gate threshold voltage v gs = v ds , i d = 250 a3.0-5.0v r ds(on) static drain to source on resistance v gs = 10v, i d = 2.25a - 1.25 1.55 g fs forward transconductance v ds = 20v, i d = 2.25a (note 4) -4.3-s c iss input capacitance v ds = 25v, v gs = 0v f = 1mhz - 490 650 pf c oss output capacitance - 66 88 pf c rss reverse transfer capacitance - 5 7.5 pf q g(tot) total gate charge at 10v v ds = 400v, i d = 5a v gs = 10v (note 4, 5) -1115nc q gs gate to source gate charge - 3 - nc q gd gate to drain ?miller? charge - 5 - nc t d(on) turn-on delay time v dd = 250v, i d = 5a r g = 25 (note 4, 5) -1336ns t r turn-on rise time - 22 54 ns t d(off) turn-off delay time - 28 66 ns t f turn-off fall time - 20 50 ns i s maximum continuous drain to source diode forward current - - 4.5 a i sm maximum pulsed drain to source diode forward current - - 18 a v sd drain to source diode forward voltage v gs = 0v, i sd = 4.5a - - 1.5 v t rr reverse recovery time v gs = 0v, i sd = 5a di f /dt = 100a/ s (note 4) -65-ns q rr reverse recovery charge - 120 - nc notes: 1: repetitive rating: pulse width limi ted by maximum junction temperature 2: l =23 mh, i as = 4.5a, v dd = 50v, r g = 25 , starting t j = 25c 3: i sd 4.5a, di/dt 200a/ s, v dd bv dss , starting t j = 25c 4: pulse test: pulse width 300 s, duty cycle 2% 5: essentially independent of operating temperature typical characteristics
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 3 typical performance characteristics figure 1. on-region characteristics figure 2. transfer characteristics figure 3. on-resistance variation vs. figure 4. body diode forward voltage drain current and gate vo ltage variation vs. source current and temperature figure 5. capacitance characteristics figure 6. gate charge characteristics 0.1 1 10 0.1 1 10 0.04 *notes: 1. 250 s pulse test 2. t c = 25 o c v gs = 15.0v 10.0v 8.0 v 7.0 v 6.5 v 6.0 v 5.5 v i d ,drain current[a] v ds ,drain-source voltage[v] 45678 0.1 1 10 150 o c *notes: 1. v ds = 20v 2. 250 s pulse test 25 o c i d ,drain current[a] v gs ,gate-source voltage[v] 20 0.00.40.81.21.6 1 10 0.2 *notes: 1. v gs = 0v 2. 250 s pulse test 150 o c i s , reverse drain current [a] v sd , body diode forward voltage [v] 25 o c 50 0 4 8 12 16 20 1.2 1.4 1.6 1.8 2.0 2.2 *note: t j = 25 o c v gs = 20v v gs = 10v r ds(on) [ ] , drain-source on-resistance i d , drain current [a] 0.1 1 10 0 250 500 750 1000 c oss c iss c iss = c gs + c gd ( c ds = shorted ) c oss = c ds + c gd c rss = c gd *note: 1. v gs = 0v 2. f = 1mhz c rss capacitances [pf] v ds , drain-source voltage [v] 30 036912 0 2 4 6 8 10 *note: i d = 5a v ds = 100v v ds = 250v v ds = 400v v gs , gate-source voltage [v] q g , total gate charge [nc]
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 4 typical performance characteristics (continued) figure 7. breakdown voltage variation figure 8. maximum safe operating area vs. temperature - fdp5n50f figure 9. maximum safe operating area figure 10. maximum drain current - fdpf5n50ft figure 11. transient thermal response curve - fdp5n50f -75 -25 25 75 125 175 0.8 0.9 1.0 1.1 1.2 *notes: 1. v gs = 0v 2. i d = 250 a bv dss , [normalized] drain-source breakdown voltage t j , junction temperature [ o c ] 1 10 100 1000 0.01 0.1 1 10 30 30 s 100 s 1ms 10ms i d , drain current [a] v ds , drain-source voltage [v] operation in this area is limited by r ds(on) *notes: 1. t c = 25 o c 2. t j = 150 o c 3. single pulse dc 25 50 75 100 125 150 0 2 4 i d , drain current [a] t c , case temperature [ o c ] 5 1 10 100 1000 0.01 0.1 1 10 30 30 s 100 s 1ms 10ms i d , drain current [a] v ds , drain-source voltage [v] operation in this area is limited by r ds(on) *notes: 1. t c = 25 o c 2. t j = 150 o c 3. single pulse dc 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 0.01 0.1 1 0.003 0.01 0.1 0.2 0.05 0.02 *notes: 1. z jc (t) = 1.4 o c/w max. 2. duty factor, d= t 1 /t 2 3. t jm - t c = p dm * z jc (t) 0.5 single pulse thermal response [ z jc ] rectangular pulse duration [sec] 3 t 1 p dm t 2
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 5 typical performance characteristics (continued) figure 12. transient thermal response curve - fdpf5n50ft 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 10 3 0.01 0.1 1 10 0.01 0.1 0.2 0.05 0.02 *notes: 1. z t jc (t) = 4.5 o c/w max. 2. duty factor, d= t 1 /t 2 3. t jm - t c = p dm * z t jc (t) 0.5 single pulse thermal response [ z t jc ] rectangular pulse duration [sec] 0.005 t 1 p dm t 2
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 6 gate charge test circuit & waveform resistive switching test circuit & waveforms unclamped inductive switching test circuit & waveforms
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 7 peak diode recovery dv/dt test circuit & waveforms dut v ds + _ driver r g same type as dut v gs ? dv/dt controlled by r g ?i sd controlled by pulse period v dd l i sd 10v v gs ( driver ) i sd ( dut ) v ds ( dut ) v dd body diode forward voltage drop v sd i fm , body diode forward current body diode reverse current i rm body diode recovery dv/dt di/dt d = gate pulse width gate pulse period -------------------------- dut v ds + _ driver r g same type as dut v gs ? dv/dt controlled by r g ?i sd controlled by pulse period v dd l l i sd 10v v gs ( driver ) i sd ( dut ) v ds ( dut ) v dd body diode forward voltage drop v sd i fm , body diode forward current body diode reverse current i rm body diode recovery dv/dt di/dt d = gate pulse width gate pulse period -------------------------- d = gate pulse width gate pulse period --------------------------
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 8 mechanical dimensions to-220
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 9 package dimensions dimensions in millimeters to-220f potted * front/back side isolation voltage : ac 2500v
fdp5n50f / fdpf5n50ft n-channel mosfet, frfet fdp5n50f / fdpf5n50ft rev. c1 www.fairchildsemi.com 10 trademarks the following includes registered and unregistered trademarks and se rvice marks, owned by fairchild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes wi thout further notice to any products herein to improve reliability, function, or design. fairchild does not assume any li ability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s worldwid e terms and conditions, specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized for use as critical components in life support d evices or systems without the express written approval of fairchild semiconductor corporation. as used here in: 1. life support devices or systems ar e devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a sign ificant injury of the user. 2. a critical component in any com ponent of a life su pport, device, or system whose failure to perform can be reasonably ex pected to cause the failure of the life sup port device or system, or to affect its safety or effectiveness. product status definitions definition of terms 2cool? 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